X-ray Nondestructive Testing Instrument - Application in LED Semiconductor Industry


X-ray non-destructive tester battery industry application

LED semiconductor industry analysis and application range:

LED chip, LED internal bonding line, LED crystal line, LED wafer, copper column and other detection diodes, three-stage tube, capacitor connector, etc.


LED process defect introduction

(1) IC chip, diode hole, bubble. Cause: Less tin furnace temperature solder paste stirring


(2) LED internal binding line, LED crystal line IC package, judge: whether the line is off, the angle of the line


(3) Discrimination of other defects: internal detection of capacitors, wafers, and connectors


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Email: andy.liu@elt-usa.com

ELT Technology(Shenzhen)Co., Ltd. 

Address: Third floor, Building 3, Yuheng Industrial Park,Tantou Community, Songgang, Baoan ,Shenzhen 518105 China 

Tel: 0755-29411968

Fax: 0755-27330185

E-mail: andy.liu@elt-usa.com

Website: Http://www.elt-usa.com


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